H o m e | P e o p l e | I n s t r u m e n t s | W o r k s h o p s | C o n t a c t | U n i v e r s i t y

NameMake / ModelSpecification
Scanning Electron MicroscopeHitachi; S-530Resolution: 5 nm; Magnification: 20-150000x; Acceleration voltage: 0.8, 1.5, 2, 3, 4, 5, 10, 15, 20, 25 kV. (more ...)
Fluroscence SpectrometerPerkin Elmer; LS 55Xenon discharge lamp (source); Gated photomultiplier/Red sensitive photomultiplier (detector); Excitation: 200-800 nm; Emission: 200-650 nm with standard PM; 200-900 nm with optional R298 PM; wavelength Accuracy: +- 1.0 nm; Wavelength repeatability: +- 0.05 nm; Spectral bandpass: Excitation slits (2.5-15.0 nm) & Emission slits (2.5-20.0 nm)
UV-VIS SpectrophotometerShimadzu; UV-2600;Wavelength range: 185-900 nm; Resolution: 0.1 nm; Wavelength repeatability: +- 0.05 nm; Wavelength scanning speed: 4000 nm/min to 0.05 nm/min
Fluroscence MicroscopeLeica; DM 1000Objective: 10x, 20x, 40x, 100x;
UV340-380400LP 425
Blue450-490510LP 515
Green515-560580LP 590
Single Crystal X-Ray DiffractometerBruker; Smart APEX-IIMo Tube (X-Ray source); 3 Axes goniometer; 512px X 512 px CCD camera (detector)
X-Ray Fluorescence spectrometernano Bruker; ARTAXMo Tube (X-Ray source); Si- drift detector
Transmission Electron MicroscopeJEOL; JEM 1400 plus120 KeV

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**SC-XRD requisition form (Download, fill and send along with the crystal)

Courtsey: USIC, The University of Burdwan, Golapbag, Burdwan – 713104, West Bengal