Instruments
Name		Make / Model		Specification
Scanning Electron Microscope		Hitachi; S-530		Resolution: 5 nm; Magnification: 20-150000x; Acceleration voltage: 0.8, 1.5, 2, 3, 4, 5, 10, 15, 20, 25 kV. (more ...)
Fluroscence Spectrometer		Perkin Elmer; LS 55		Xenon discharge lamp (source); Gated photomultiplier/Red sensitive photomultiplier (detector); Excitation: 200-800 nm; Emission: 200-650 nm with standard PM; 200-900 nm with optional R298 PM; wavelength Accuracy: +- 1.0 nm; Wavelength repeatability: +- 0.05 nm; Spectral bandpass: Excitation slits (2.5-15.0 nm) & Emission slits (2.5-20.0 nm)
UV-VIS Spectrophotometer		Shimadzu; UV-2600;		Wavelength range: 185-900 nm; Resolution: 0.1 nm; Wavelength repeatability: +- 0.05 nm; Wavelength scanning speed: 4000 nm/min to 0.05 nm/min
Fluroscence Microscope		Leica; DM 1000		Objective: 10x, 20x, 40x, 100x; Excitation Excitation filter (nm) Mirror (nm) Suppression filter (nm) UV 340-380 400 LP 425 Blue 450-490 510 LP 515 Green 515-560 580 LP 590
Single Crystal X-Ray Diffractometer		Bruker; Smart APEX-II		Mo Tube (X-Ray source); 3 Axes goniometer; 512px X 512 px CCD camera (detector)
X-Ray Fluorescence spectrometer		nano Bruker; ARTAX		Mo Tube (X-Ray source); Si- drift detector
Transmission Electron Microscope		JEOL; JEM 1400 plus		120 KeV
***Analytical Service Charges
**SC-XRD requisition form (Download, fill and send along with the crystal)